Description of
Equipment:
Equipment: X-ray Diffractometer
Maker: Bruker D8 Advance
Equipment Characteristics:
Vertical Goniometer, flash detector (NaI),
tube with Cu anode, graphite at detector
entrance, Ni filter for the Kb line of the
Cu, nine-position sample holder.
Minimum step 2q: 0.001°
2q Range: up to 150°
Services: allows measuring
diffractographs for powder samples, mono-crystals,
and films in the Bragg-Brentano (q-2q) geometry,
and in detector sweeping mode for a fixed
incidence angle (scan detector). It is possible
to determine the presence of crystalline
phases, grain size, and the presence of
amorphous component, presence of mechanical
stress, preferential orientations, as well
as the information gathered from a Riedvelt
adjustment.
Foto DRX1: DRX D8 Advance
NOTE: This
equipment was acquired by Universidad del
Quíndio; it is included in this listing
by request of Professor Hernando Ariza to
offer its services to the nation’s
scientific community
|
