Description of
Equipment:
Equipment: Profilometer
Maker: Dektak 8000
Characteristics of Equipment:
12.5 mm radius (45°) and 0.7 mm radius
(60°) tips. Sample holder with x and
y movement.
Vertical range: de 2.5
nm a 262 mm
Vertical resolution: 1Å/65kÅ;
10Å/655kÅ; 40Å/2620kÅ
Calibration: kit available
for height calibrations at 50, 5, 1, 0.500,
0.200 kÅ.
Services: Permits measuring
height vibrations on a surface with a needle
that sweeps it to obtain its profile. Sweeping
velocity can be controlled, along with the
force of the tip (1-100 mg) and the sweeping
position, which permits tracing the surface
topography.
NOTE: This equipment was acquired by Universidad
del Quíndio; it is included in this
listing by request of Professor Hernando
Ariza to offer its services to the nation’s
scientific community. |
